28F016SV Просмотр технического описания (PDF) - Intel

Номер в каталоге

Компоненты Описание

производитель

28F016SV

16-MBIT (1 MBIT x 16, 2 MBIT x 8) FlashFile™ MEMORY

Intel 

E

28F016SV FlashFile™ MEMORY

2.4

2.0

INPUT

TEST POINTS

0.8

0.45

2.0

OUTPUT

0.8

AC test inputs are driven at VOH (2.4 VTTL) for a Logic “1” and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at VIH

(2.0 VTTL) and VIL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise and fall times (10% to 90%) <10 ns.

Figure 7. Transient Input/Output Reference Waveform for

VCC = 5V ± 10% (Standard Testing Configuration)(1)

0528_07

3.0

INPUT

1.5

0.0

TEST POINTS

1.5 OUTPUT

AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.

Input rise and fall times (10% to 90%) <10 ns.

Figure 8. Transient Input/Output Reference Waveform for VCC = 3.3V ± 0.3V

and VCC = 5V ± 5% (High Speed Testing Configuration)(2)

NOTES:

1. Testing characteristics for 28F016SV-070 (Standard Testing Configuration) and 28F016SV-080.

2. Testing characteristics for 28F016SV-065/28F016SV-075 and 28F016SV-70 (High Speed Testing Configuration)/

28F016SV-120.

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