ISL3170E Просмотр технического описания (PDF) - Renesas Electronics
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ISL3170E Datasheet PDF : 21 Pages
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ISL3170E, ISL3171E, ISL3172E, ISL3173E, ISL3174E, ISL3175E, ISL3176E, ISL3177E, ISL3178E
Electrical Specifications Test Conditions: VCC = 3.0V to 3.6V; unless otherwise specified. Typicals are at VCC = 3.3V, TA = +25°C,
(Note 6)
PARAMETER
SYMBOL
TEST CONDITIONS
TEMP MIN
MAX
(°C) (Note 20) TYP (Note 20) UNITS
Receiver Disable from Output High
tHZ
RL = 1kΩ, CL = 15pF, ISL3170E-75E
SW = GND (Figure 9,
Note 14)
ISL3176E-78E
Full
5
12
20
ns
Full
4
7
15
ns
Receiver Disable from Output Low
tLZ
RL = 1kΩ, CL = 15pF, ISL3170E-75E
SW = VCC (Figure 9,
Note 14)
ISL3176E-78E
Full
5
13
20
ns
Full
4
7
15
ns
Time to Shutdown
Receiver Enable from Shutdown to
Output High
tSHDN (Notes 11, 14)
tZH(SHDN) RL = 1kΩ, CL = 15pF, SW = GND
(Figure 9, Notes 11, 13, 14)
Full
50
180
600
ns
Full
-
240
500
ns
Receiver Enable from Shutdown to tZL(SHDN) RL = 1kΩ, CL = 15pF, SW = VCC
Output Low
(Figure 9, Notes 11, 13, 14)
Full
-
240
500
ns
NOTES:
6. All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground unless
otherwise specified.
7. Supply current specification is valid for loaded drivers when DE = 0V.
8. Applies to peak current. See “Typical Performance Curves” starting on page 14 for more information.
9. When testing devices with the shutdown feature, keep RE = 0 to prevent the device from entering SHDN.
10. When testing devices with the shutdown feature, the RE signal high time must be short enough (typically <100ns) to prevent the device from
entering SHDN.
11. Versions with a shutdown feature are put into shutdown by bringing RE high and DE low. If the inputs are in this state for less than 50ns, the
parts are ensured not to enter shutdown. If the inputs are in this state for at least 600ns, the parts are ensured to have entered shutdown. See
“Low Power Shutdown Mode” on page 13.
12. Keep RE = VCC, and set the DE signal low time >600ns to ensure that the device enters SHDN.
13. Set the RE signal high time >600ns to ensure that the device enters SHDN.
14. Does not apply to the ISL3171E, ISL3174E, or ISL3177E.
15. tSKEW is the magnitude of the difference in propagation delays of the specified terminals of two units tested with identical test conditions (VCC,
temperature, etc.). Applies only to the ISL3176E through ISL3178E.
16. ISL3170E through ISL3175E only.
17. VCC ≥ 3.15V.
18. Limits established by characterization and are not production tested.
19. If the Tx or Rx enable function is not needed, connect the enable pin to the appropriate supply (see “Pin Descriptions” on page 4) through a 1kΩ
to 3kΩ resistor.
20. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by
characterization and are not production tested.
21. If the DE or RE input voltage exceeds the VCC voltage by more than 500mV, then current will flow into the logic pin. The current is limited by a
340Ω resistor (so ≈ 13mA with VIN = 5V and VCC = 0V) so no damage will occur if VCC ≤ VIN ≤ 7V for short periods of time.
FN6307 Rev.6.00
Aug 31, 2017
Page 9 of 21
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