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2SC3757 Просмотр технического описания (PDF) - Panasonic Corporation

Номер в каталоге
Компоненты Описание
производитель
2SC3757
Panasonic
Panasonic Corporation Panasonic
2SC3757 Datasheet PDF : 3 Pages
1 2 3
2SC3757
Switching time measurement circuit
ton , toff test circuit
0.1 µF
tstg test circuit
0.1 µF
240
VOUT
VOUT
VIN = 10 V 3.3 k
220
50
A 910
VIN = 10 V 0.1 µF 500
1 k
90
200
PC Ta
50
3.3 k
VCC = 3 V
50
500
VCC = 10 V
160
VBB = −3 V
VBB = 2 V
10%
VIN
10%
120
10%
VIN
80
90%
VOUT
90%
ton
toff
VOUT
tstg
10%
(Waveform at A)
40
0
0
40
80
120
160
Ambient temperature Ta (°C)
e/ pe) IC VCE
c ty 120
n d ge. ed Ta=25°C
le sta ontinu 100
IB = 3.0 mA
a e cyc isc 2.5mA
life , d 80
2.0 mA
n u duct typed 1.5mA
ro d 60
te tin P ue 1.0mA
four ntin 40
g co 0.5 mA
in n llowin ddis 20
des fo , plane 0
a o clu pe 0 0.2 0.4 0.6 0.8 1.0 1.2
c d in e ty Collector-emitter voltage VCE (V)
VCE(sat) IC
100
IC / IB = 10
10
1
Ta = 75°C
25°C
25°C
0.1
0.01
0.1
1
10
100
Collector current IC (mA)
VBE(sat) IC
100
10
1
Ta = −25°C
25°C
75°C
0.1
0.01
1
10
100
1 000
Collector current IC (mA)
M is/Discontimnuaeintenanc hFE IC
fT IE
e e, 600
600
D anc typ VCE = 1 V
VCB = 10 V
Ta = 25°C
inten nce 500
500
Ma aintena 400
400
(planed m 300
300
Cob VCB
6
IE = 0
f = 1 MHz
Ta = 25°C
5
4
3
200
Ta = 75°C
200
2
25°C
100
25°C
100
1
0
0.1
1
10
100
Collector current IC (mA)
0
1
10
100
1 000
Emitter current IE (mA)
0
1
10
100
Collector-base voltage VCB (V)
2
SJC00136CED

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