SST37VF010-70-3C-NHE Просмотр технического описания (PDF) - Silicon Storage Technology

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производитель

SST37VF010-70-3C-NHE

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit (x8) Many-Time Programmable Flash

Silicon Storage Technology 

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Many-Time Programmable Flash

SST37VF512 / SST37VF010 / SST37VF020 / SST37VF040

VIHT

INPUT

VIT

REFERENCE POINTS

VOT

OUTPUT

VILT

1151 F06.1

AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points

for inputs and outputs are VIT (0.5 V) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.

FIGURE 8: AC Input/Output Reference Waveforms

Note: VIT - VINPUT Test

VOT - VOUTPUT Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

TO DUT

1151 F07.1

FIGURE 9: A Test Load Example

TO TESTER

CL

©2006 Silicon Storage Technology, Inc.

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