S-8211C Просмотр технического описания (PDF) - Seiko Instruments Inc
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S-8211C Datasheet PDF : 41 Pages
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Rev.5.0_00
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211C Series
3. Detection Delay Time
(1) S-8211CAA, S-8211CAH, S-8211CAI, S-8211CAJ, S-8211CAK,S-8211CAL, S-8211CAM, S-8211CAN, S-
8211CAR, S-8211CAS, S-8211CAU, S-8211CAY,S-8211CAZ, S-8211CBA, S-8211CBB
Table 10
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Condi-
tion
Test
Circuit
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta = −40 to +85 °C) *1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
tCU
tDL
tDIOV
tSHORT
tCIOV
tCU
tDL
tDIOV
tSHORT
tCIOV
−
0.96 1.2 1.4 s 9
5
−
120 150 180 ms 9
5
−
7.2
9
11 ms 10
5
−
240 300 360 µs 10
5
−
7.2
9
11 ms 10
5
−
0.7 1.2 2.0 s 9
5
−
83 150 255 ms 9
5
−
5
9
15 ms 10
5
−
150 300 540 µs 10
5
−
5
9
15 ms 10
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
(2) S-8211CAB, S-8211CAV
Table 11
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Condi-
tion
Test
Circuit
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta = −40 to +85 °C) *1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
tCU
tDL
tDIOV
tSHORT
tCIOV
tCU
tDL
tDIOV
tSHORT
tCIOV
−
0.96 1.2 1.4 s 9
5
−
120 150 180 ms 9
5
−
7.2
9
11 ms 10
5
−
450 560 670 µs 10
5
−
7.2
9
11 ms 10
5
−
0.7 1.2 2.0 s 9
5
−
83 150 255 ms 9
5
−
5
9
15 ms 10
5
−
260 560 940 µs 10
5
−
5
9
15 ms 10
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
Seiko Instruments Inc.
11
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