S-8211C Просмотр технического описания (PDF) - Seiko Instruments Inc
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S-8211C Datasheet PDF : 41 Pages
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BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211C Series
Rev.5.0_00
(3) S-8211CAD
Table 12
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Condi-
tion
Test
Circuit
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta = −40 to +85 °C) *1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
tCU
tDL
tDIOV
tSHORT
tCIOV
tCU
tDL
tDIOV
tSHORT
tCIOV
−
115 143 172 ms 9
5
−
30 38 46 ms 9
5
−
14.5 18 22 ms 10
5
−
240 300 360 µs 10
5
−
7.2
9
11 ms 10
5
−
82 143 240 ms 9
5
−
20 38 65 ms 9
5
−
10 18 30 ms 10
5
−
150 300 540 µs 10
5
−
5
9
15 ms 10
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
(4) S-8211CAE, S-8211CAT, S-8211CAX, S-8211CBR
Table 13
Test
Test
Item
Symbol
Condition
Min. Typ. Max. Unit Condi-
Circuit
tion
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta = −40 to +85 °C) *1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
tCU
tDL
tDIOV
tSHORT
tCIOV
tCU
tDL
tDIOV
tSHORT
tCIOV
−
0.96 1.2 1.4 s 9
5
−
120 150 180 ms 9
5
−
14.5 18 22 ms 10
5
−
240 300 360 µs 10
5
−
7.2
9
11 ms 10
5
−
0.7 1.2 2.0 s 9
5
−
83 150 255 ms 9
5
−
10 18 30 ms 10
5
−
150 300 540 µs 10
5
−
5
9
15 ms 10
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
12
Seiko Instruments Inc.
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