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SAA5265 Просмотр технического описания (PDF) - Philips Electronics

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SAA5265 Datasheet PDF : 24 Pages
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Philips Semiconductors
10 and 1 page intelligent teletext decoders
Preliminary specification
SAA5264; SAA5265
QUALITY AND RELIABILITY
This device will meet Philips Semiconductors general quality specification for business group “Consumer Integrated
Circuits SNW-FQ-611-Part E”. The principal requirements are shown in Tables 4 to 7.
Group A
Table 4 Acceptance tests per lot; note 1
Mechanical
Electrical
TEST
REQUIREMENTS
cumulative target: <80 ppm
cumulative target: <100 ppm
Note
1. ppm = fraction of defective devices, in parts per million.
Group B
Table 5 Processability tests (by package family)
Solderability
Mechanical
Solder heat resistance
TEST
0/16 on all lots
0/15 on all lots
0/15 on all lots
REQUIREMENTS
Group C
Table 6 Reliability tests (by package family); note 1
TEST
CONDITIONS
Operational life
Humidity life
Temperature cycling performance
168 hours at Tj = 150 °C
temperature, humidity, bias 1000 hours;
Tamb = 85 °C, 85% RH (or equivalent test)
Tstg(min) to Tstg(max)
Note
1. FPM = fraction of devices failing at test condition, in Failures Per Million.
REQUIREMENTS
<1000 FPM at Tj = 150 °C
<2000 FPM
<2000 FPM
Table 7 Reliability tests (by device type)
TEST
ESD and latch-up
CONDITIONS
ESD Human body model 100 pF, 1.5 k
ESD Machine model 200 pF, 0
latch-up
REQUIREMENTS
2000 V
200 V
100 mA, 1.5 × VDD
(absolute maximum)
2000 Jan 27
16

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