ADXL330 Просмотр технического описания (PDF) - Analog Devices
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ADXL330 Datasheet PDF : 16 Pages
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ADXL330
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Acceleration (Any Axis, Unpowered)
Acceleration (Any Axis, Powered)
VS
All Other Pins
Output Short-Circuit Duration
(Any Pin to Common)
Temperature Range (Powered)
Temperature Range (Storage)
Rating
10,000 g
10,000 g
−0.3 V to +7.0 V
(COM − 0.3 V) to (VS + 0.3 V)
Indefinite
−55°C to +125°C
−65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
TP
TL
TSMAX
TSMIN
tP
RAMP-UP
CRITICAL ZONE
TL TO TP
tL
tS
PREHEAT
RAMP-DOWN
Table 3. Recommended Soldering Profile
Profile Feature
Average Ramp Rate (TL to TP)
Preheat
Minimum Temperature (TSMIN)
Maximum Temperature (TSMAX)
Time (TSMIN to TSMAX), tS
TSMAX to TL
Ramp-Up Rate
Time Maintained Above Liquidous (TL)
Liquidous Temperature (TL)
Time (tL)
Peak Temperature (TP)
Time within 5°C of Actual Peak Temperature (tP)
Ramp-Down Rate
Time 25°C to Peak Temperature
t25°C TO PEAK
TIME
Figure 2. Recommended Soldering Profile
Sn63/Pb37
3°C/s max
100°C
150°C
60 s to 120 s
3°C/s max
183°C
60 s to 150 s
240°C + 0°C/−5°C
10 s to 30 s
6°C/s max
6 minutes max
Pb-Free
3°C/s max
150°C
200°C
60 s to 180 s
3°C/s max
217°C
60 s to 150 s
260°C + 0°C/−5°C
20 s to 40 s
6°C/s max
8 minutes max
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. A | Page 4 of 16
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