GA1086MC500 Просмотр технического описания (PDF) - TriQuint Semiconductor

Номер в каталоге

Компоненты Описание

производитель

GA1086MC500

11-Output Clock Buffer

TriQuint Semiconductor 

Absolute Maximum Ratings

Storage temperature

Ambient temperature with power applied

Supply voltage to ground potential

DC input voltage

DC input current

Caution: Damage to the device may occur if an output is shorted to ground or VDD.

GA1086

–65 °C to +150 °C

–55 °C to +100 °C

–0.5 V to +7.0 V

–0.5 V to +(VDD + 0.5)

–30 mA to +5 mA

DC Characteristics

(Supply voltage: +5 V + 5% Ambient temp: 0 °C to +70 °C) 1

Symbol

VOH

VOL

VIH3

VIL3

IIL

IIH

II

IDD4

VI

Description

Output HIGH voltage

Output LOW voltage

Input HIGH level

Input LOW level

Input LOW current

Input HIGH current

Input HIGH current

Power supply current

Input clamp voltage

Test Conditions

Min

VDD = Min IOH= –30 mA

2.4

VIN= VIH or VIL

VDD = Min IOL = 30 mA

VIN= VIH or VIL

Guaranteed input logical HIGH 2.0

voltage for all inputs

Guaranteed input logical LOW

voltage for all inputs

VDD = Max

VDD = Max

VDD = Max

VDD = Max

VDD = Min

VIN = 0.40 V

VIN = 2.7 V

VIN = 5.5 V

IIN = –18 mA

Limits 2

Typ

3.6

0.2

–166

0

2

–0.62

Max

0.5

0.8

–400

25

1000

115

–1.2

Unit

V

V

V

V

µA

µA

µA

160 mA

V

Capacitance 1,5

Symbol

CIN

Description

Test Conditions

Min

Typ

Max

Unit

Input capacitance

VIN = 2.0 V at f = 1 MHz

6

pF

Notes: 1. These values apply to both the GA1086-MC500 and GA1086-MC1000.

2. Typical limits are at VDD = 5.0 V and TA = 25 °C.

3. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.

4. IDD is measured with outputs LOW and unloaded.

5. These parameters are not 100% tested, but are periodically sampled.

For additional information and latest specifications, see our website: www.triquint.com

9

Share Link: