CAT24C32BC4 Просмотр технического описания (PDF) - ON Semiconductor

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CAT24C32BC4

EEPROM Serial 32-Kb I2C ina 4-ball WLCSP

ON Semiconductor 

CAT24C32BC4, CAT24C32BAC4

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Storage Temperature

–65 to +150

°C

Voltage on Any Pin with Respect to Ground (Note 1)

–0.5 to +6.5

V

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may

undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns.

Table 2. RELIABILITY CHARACTERISTICS (Note 2)

Symbol

Parameter

Min

Units

NEND (Note 3) Endurance

1,000,000

Program/Erase Cycles

TDR

Data Retention

100

Years

2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.

3. Page Mode, VCC = 5 V, 25°C.

Table 3. D.C. OPERATING CHARACTERISTICS (VCC = 1.7 V to 5.5 V, TA = −40°C to +85°C, unless otherwise specified.)

Symbol

Parameter

Test Conditions

Min

Max

Units

ICCR

ICCW

ISB

IL

VIL

VIH

VOL

Read Current

Write Current

Standby Current

I/O Pin Leakage

Input Low Voltage

Input High Voltage

Output Low Voltage

Read, fSCL = 1 MHz

Write

0.4

mA

0.6

mA

All I/O Pins at GND or VCC

1

mA

Pin at GND or VCC

2

mA

VCC ≥ 2.2 V

−0.5

VCC x 0.3

V

VCC < 2.2 V

−0.5

VCC x 0.25

V

VCC ≥ 2.2 V

VCC x 0.7

VCC + 0.5

V

VCC < 2.2 V

VCC x 0.75

VCC + 0.5

V

VCC ≥ 2.2 V, IOL = 3.0 mA

0.4

V

VCC < 2.2 V, IOL = 1.0 mA

0.2

V

Table 4. PIN IMPEDANCE CHARACTERISTICS (VCC = 1.7 V to 5.5 V, TA = −40°C to +85°C, unless otherwise specified.)

Symbol

Parameter

Conditions

Max

Units

CIN (Note 4) SDA I/O Pin Capacitance

VIN = 0 V

8

pF

CIN (Note 4) Input Capacitance (other pins)

VIN = 0 V

6

pF

4. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.

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