C7942CA-22 Просмотр технического описания (PDF) - Hamamatsu Photonics

Номер в каталоге

Компоненты Описание

производитель

C7942CA-22

Flat panel sensor

Hamamatsu Photonics 

Flat panel sensor

C7942CA-22

Notice

· Do not subject the flat panel sensors to strong vibration or shock (Strong shock such as drop impacts may cause permanent damage

to these sensors).

· Users must take responsibility for implementing X-ray shielding safety measures to avoid the risk of X-ray exposure.

· Data listed in this datasheet is defined at the time of shipment. Characteristics may vary somewhat due to exposure to X-rays so take

proper coutermeasures such as making periodic image correction.

· This product is warranted for a period of 12 months after the date of the shipment.

The warranty is limited to make a replacement or repair of any defective product due to defects in workmanship or materials used in

manufacture. The warranty does not cover loss or damage caused by natural disaster, misuse (including modifications and any use not

complying with the environment, application, usage and storage conditions described in this datasheet), or total radiation dose over 1

million Roentgen (incident X-ray energy: less than 100 kVp) even within the warranty period.

· As described above, flat panel sensors have limited resistance to radiation. This must be taken into account when using a flat panel

sensor under continuous irradiation (This sensor cannot be used for in-line application).

. When using flat panel sensors in non-destructive inspection equipment, please contact us and provide information such as irradiation

conditions.

Description of terms

Blemish

Length of pixel cluster which has less than 90 % of the average sensitivity of the surrounding pixels.

Bright line output adjacent to a defect line

The relative sensitivity ratio “a/b” should be 120 % or less for both vertical and horizontal

lines, where “a” and “b” are defined as follows:

a: Average sensitivity of bright line (Line A) adjacent to defect line

b: Average sensitivity of standard line (Line B) adjacent to Line A

Note that the average sensitivity of the bright line is calculated from the region adjacent to

the defect region in the defect line.

Example: See the right figure.

Defect region in defect line: From pixel (J, 1) to pixel (J, 15)

a: Average sensitivity from pixel (I, 1) to pixel (I, 15) or from pixel (K, 1) to pixel (K, 15)

b: Average sensitivity from pixel (H, 1) to pixel (H, 15) or from pixel (L, 1) to pixel (L, 15)

Column

A B CD E F GH I J K LMNOPQR S

1

2

3

4

5

6

7

8

9

Line B

10

(Column H, L)

11

12

13

Line A

14

(Column I, K)

15

16

17

Defect line

18

(Column J)

19

20

21

22

KACCC0385EB

Defect cluster

Formed with more than 3 × 3 pixels which have less

than 1/8 of the average sensitivity of the surrounding pixels.

This is defined as defect cluster. This is not defined as defect cluster.

Normal pixel

Defective pixel

KACCC0384EB

7

Share Link: