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IDT70V658S

HIGH-SPEED 3.3V 64K x 36 ASYNCHRONOUS DUAL-PORT STATIC RAM

Unspecified 

IDT70V658S

High-Speed 3.3V 64K x 36 Asynchronous Dual-Port Static RAM

AC Test Conditions (VDDQ - 3.3V/2.5V)

Input Pulse Levels

Input Rise/Fall Times

GND to 3.0V / GND to 2.5V

2ns Max.

Input Timing Reference Levels

1.5V/1.25V

Output Reference Levels

1.5V/1.25V

Output Load

Figures 1 and 2

5613 tbl 11

Preliminary

Industrial and Commercial Temperature Ranges

2.5V

DATAOUT

770Ω

833Ω

5pF*

DATAOUT

50Ω

50Ω

10pF

(Tester)

Figure 1. AC Output Test load.

,

3.3V

,

1.5V/1.25

5613 drw 03

DATAOUT

435Ω

590Ω

5pF*

,

5613 drw 04

Figure 2. Output Test Load

(For tCKLZ, tCKHZ, tOLZ, and tOHZ).

*Including scope and jig.

10.5pF is the I/O capacitance of this

device, and 10pF is the AC Test Load

Capacitance.

7

6

5

∆tAA

4

(Typical, ns) 3

2

1

-1

•

•

•

20.5 30 50

•

80 100

200

,

Capacitance (pF)

5613 drw 05

Figure 3. Typical Output Derating (Lumped Capacitive Load).

9

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