IDT82P2282PFG Просмотр технического описания (PDF) - Integrated Device Technology
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IDT82P2282PFG Datasheet PDF : 381 Pages
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IDT82P2282
DUAL T1/E1/J1 LONG HAUL / SHORT HAUL TRANSCEIVER
Name
TMS
TCK
TDI
TDO
VDDDIO[0]
VDDDIO[1]
VDDDIO[2]
GNDDIO[0]
GNDDIO[1]
GNDDIO[2]
VDDDC[0]
VDDDC[1]
VDDDC[2]
VDDDC[3]
GNDDC[0]
GNDDC[1]
GNDDC[2]
GNDDC[3]
VDDAR[1]
VDDAR[2]
GNDAR[1]
GNDAR[2]
VDDAT[1]
VDDAT[2]
GNDAT[1]
GNDAT[2]
VDDAX[1]
VDDAX[2]
GNDAX[1]
GNDAX[2]
VDDAP
GNDAP
VDDAB
GNDAB
Type
Input
Input
Input
High-Z
Power
Ground
Power
Ground
Power
Ground
Power
Ground
Power
Ground
Power
Ground
Power
Ground
Pin No.
Description
100 TMS: Test Mode Select
The signal on this pin controls the JTAG test performance and is sampled on the rising edge of TCK. This pin is a
Schmitt-triggered input with an internal pull-up resistor.
98 TCK: Test Clock
The clock for the JTAG test is input on this pin. TDI and TMS are sampled on the rising edge of TCK and TDO is
clocked out of the device on the falling edge of TCK. This pin is a Schmitt-triggered input with an internal pull-up resis-
tor.
99 TDI: Test Input
The test data is sampled at this pin on the rising edge of TCK. This pin has an internal pull-up resistor. This pin is a
Schmitt-triggered input with an internal pull-up resistor.
96 TDO: Test Output
The test data are output on this pin. It is updated on the falling edge of TCK. This pin is High-Z except during the pro-
cess of data scanning.
Power & Ground
93 VDDDIO[2:0]: 3.3 V I/O Power Supply
40
64
89 GNDDIO[2:0]: Digital Pad Ground
44
59
91 VDDDC[3:0]: 1.8 V Digital Core Power Supply
42
61
3
88 GNDDC[3:0]: Digital Core Ground
45
58
4
26 VDDAR[2:1]: 3.3 V Power Supply for Receiver
13
29 GNDAR[2:1]: Analog Ground for Receiver
10
25 VDDAT[2:1]: 3.3 V Power Supply for Transmitter
14
24 GNDAT[2:1]: Analog Ground for Transmitter
15
20 VDDAX[2:1]: 3.3 V Power Supply for Transmit Driver
19
23 GNDAX[2:1]: Analog Ground for Transmitter Driver
16
6 VDDAP: 3.3 V Power Analog PLL
5 GNDAP: Analog Ground PLL
8 VDDAB: 3.3 V Power Analog Bias
7 GNDAB: Analog Ground Bias
TEST
Pin Description
20
August 20, 2009
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