MSK6000RH Просмотр технического описания (PDF) - Anaren Microwave

Номер в каталоге

Компоненты Описание

производитель

MSK6000RH

RAD HARD DUAL HIGH SIDE DRIVER WITH CURRENT SENSE

Anaren Microwave 

APPLICATION NOTES

PIN FUNCTIONS

VIN - The VIN pins are connected to sources of

MOSFETs. They provide the voltage supply that is

switched to the output pins. High di/dt can be present

at these pins during switch on and off transitions.

Decoupling capacitors are recommended to minimize

voltage spikes.

VCC - The VCC pins power the current sense amplifier.

The VCC pins should be connected to low impedance

positive supply source.

VOUT - The VOUT pins connect to drains of internal

MOSFETs and are the device power outputs.

CTL - The CTL pins connect to the high side switch

enabling circuits. When a logic high voltage is present,

the high side switches turn on passing power from

VIN to VOUT. The CTL pin threshold has no hysterisis.

It operates in a linear region between 2.0V typical (OFF)

and 2.7V typical (ON) at 25°C, 1.3V typical (OFF)

and 2.2V typical (ON) at 125°C, and 2.6V typical

(OFF) and 3.0V typical (ON) at -55°C. Input signals

with fast transitions are recommended to prevent ex-

cessive power dissipation.

IMON - The IMON pins connect to the output of the

internal RH6105 current sense amplifiers. Voltage drop

across internal current sense resistor is amplified and a

scaled current is sourced from the IMON pin. The ratio

of IMON current to source current is 0.20mA/A. When

terminated with a 5KΩ resistor the output voltage is

1V/A.

GND - The GND pins are the reference for each driver

circuit. Each channel has it's own ground. The control

input signals and current sense outputs are referenced

to the respective grounds.

CASE - The CASE connection pins provide an electri-

cal connection to the MSK6000RH package. They are

electrically isolated from the internal circuitry.

TOTAL DOSE RADIATION TEST

PERFORMANCE

Radiation performance curves for TID testing have

been generated for all radiation testing performed by

MS Kennedy. These curves show performance trends

throughout the TID test process and are located in the

MSK6000RH radiation test report. The complete ra-

diation test report is available in the RAD HARD PROD-

UCTS section on the MSK website.

TYPICAL APPLICATION CIRCUIT

HIGH VIN APPLICATION CIRCUIT

3

8548-114 Rev. F 10/14

Share Link: