2SK2956 Просмотр технического описания (PDF) - Unspecified
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2SK2956 Datasheet PDF : 7 Pages
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2SK2956
www.VBsemi.tw
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
Parameter
Symbol
Test Conditions
Static
Drain-Source Breakdown Voltage
VDS
VGS = 0 V, ID = 250 µA
VDS Temperature Coefficient
VGS(th) Temperature Coefficient
VDS/TJ
VGS(th)/TJ
ID = 250 µA
Gate-Source Threshold Voltage
VGS(th)
VDS = VGS, ID = 250 µA
Gate-Source Leakage
IGSS
VDS = 0 V, VGS = ± 20 V
Zero Gate Voltage Drain Current
On-State Drain Currenta
IDSS
ID(on)
VDS = 30 V, VGS = 0 V
VDS = 30 V, VGS = 0 V, TJ = 55 °C
VDS 5 V, VGS = 10 V
Drain-Source On-State Resistancea
Forward Transconductancea
Dynamicb
RDS(on)
gfs
VGS = 10 V, ID = 28.8 A
VGS = 4.5 V, ID = 27 A
VDS = 15 V, ID = 28.8 A
Input Capacitance
Ciss
Output Capacitance
Coss
VDS = 15 V, VGS = 0 V, f = 1 MHz
Reverse Transfer Capacitance
Crss
Total Gate Charge
Qg
VDS = 15 V, VGS = 10 V, ID = 28.8 A
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
Gate Resistance
Rg
Turn-On Delay Time
td(on)
Rise Time
tr
Turn-Off Delay Time
td(off)
Fall Time
tf
Turn-On Delay Time
td(on)
Rise Time
tr
Turn-Off Delay Time
td(off)
Fall Time
tf
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulse Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Reverse Recovery Fall Time
ta
Reverse Recovery Rise Time
tb
Notes:
a. Pulse test; pulse width 300 µs, duty cycle 2 %.
b. Guaranteed by design, not subject to production testing.
VDS = 15 V, VGS = 4.5 V, ID = 28.8 A
f = 1 MHz
VDD = 15 V, RL = 0.625
ID 24 A, VGEN = 10 V, Rg = 1
VDD = 15 V, RL = 0.67
ID 22.5 A, VGEN = 4.5 V, Rg = 1
TC = 25 °C
IS = 22 A
IF = 20 A, di/dt = 100 A/µs, TJ = 25 °C
Min.
30
1.5
90
Typ. Max. Unit
35
- 7.5
0.0010
0.0014
160
2.5
± 100
1
10
0.0014
0.0017
V
mV/°C
V
nA
µA
A
S
12065
1725
pF
970
171
257
81.5
123
nC
34
29
1.4
2.1
18
27
11
17
70
105
10
15
ns
55
83
180
270
55
83
12
18
90
A
90
0.8
1.2
V
52
78
ns
70.2
105
nC
27
ns
25
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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