PL610-01D8C Просмотр технического описания (PDF) - Microchip Technology

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производитель

PL610-01D8C

1.8V to 3.3V Single IC XO with Frequency Tuning (10 MHz to 130 MHz)

Microchip Technology 

3.0 MEASUREMENT TEST

CIRCUITS (MTC)

A

0.1μF

VDD

XIN

CLK

XOUT

OE^ GND

FET

Probe

CL

FIGURE 3-1:

MTC-1: Rise Time, Fall

Time, Duty Cycle, VOL, VOH, IDD, Power Down

Current, Output Enable/Disable.

0.1μF

VDD

XIN

CLK

XOUT

OE^ GND

FET

Probe

0.1μF V

FIGURE 3-2:

MTC-2: Output Drive

Current and Output Impedance.

PL610-01/-02/-03

0.1μF

VDD

XIN

CLK

XOUT

OE^ GND

R 0.1μF

FIGURE 3-3:

Noise.

MTC-3: Jitter and Phase

Network

Analyzer

VDD

XIN

CLK

XOUT

OE^ GND

0.1μF

FIGURE 3-4:

Resistance.

MTC-4: Negative

 2016 Microchip Technology Inc.

DS20005616A-page 9

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