WM8581
Production Data
Test Conditions
AVDD, PVDD, VREFP = 5V, DVDD = 3.3V, AGND, VREFN = 0V, PGND, DGND = 0V, TA = +25oC, 1kHz Signal, fs = 48kHz,
24-Bit Data, Slave Mode, MCLK, ADCMCLK = 256fs, 1Vrms Input Signal Level unless otherwise stated.
PARAMETER
SYMBOL TEST CONDITIONS
MIN
TYP
MAX
UNIT
Power Supply Rejection Ratio
PSRR
1kHz 100mVp-p
50
dB
(See note 4)
20Hz to 20kHz
45
dB
ADC Performance
100mVp-p
Full Scale Input Signal Level (for
ADC 0dB Input)
Input resistance
Vrms
1.0xVREFP/5
6
kΩ
Input capacitance
10
pF
Signal to Noise Ratio (See
Terminology note 1,2,4)
SNR
90
100
dB
A-Weighted
@ fs = 48kHz
Unweighted,
97
dB
@ fs = 48kHz
97
dB
A-Weighted
@ fs = 48kHz, AVDD =
3.3V
97
dB
w
A-Weighted
@ fs = 96kHz
Unweighted,
@ fs = 96kHz
94
dB
94
dB
PD Rev 4.0 April 2007
12