DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

SPT7820ACS Просмотр технического описания (PDF) - Signal Processing Technologies

Номер в каталоге
Компоненты Описание
производитель
SPT7820ACS
SPT
Signal Processing Technologies SPT
SPT7820ACS Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
TEST LEVEL CODES
TEST LEVEL
All electrical characteristics are subject to the
I
following conditions:
II
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
III
cates the specific device testing actually per-
IV
formed during production and Quality Assur-
ance inspection. Any blank section in the data
V
column indicates that the specification is not
tested at the specified condition.
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
Figure 1A: Timing Diagram
N
tpwH
CLK
Output
Data
N-2
Figure 1B: Single Event Clock
CLK
Output
Data
N+1
N+2
tpwL
td
N-1
Data Valid
N
Data Valid
N+1
td
Data Valid
Table I - Timing Parameters
PARAMETERS
td
tpwH
tpwL
DESCRIPTION
MIN
CLK to Data Valid Prop Delay
-
CLK High Pulse Width
20
CLK Low Pulse Width
20
SPT
4
TYP
MAX
14
18
-
300
-
-
UNITS
ns
ns
ns
SPT7820
3/11/97

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]