FIN1017 Просмотр технического описания (PDF) - ON Semiconductor

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FIN1017

3.3V LVDS, 1-Bit, High-Speed Differential Driver

ON Semiconductor 

Test Diagrams

Figure 3. Differential Driver DC Test Circuit

Figure 4. Differential Driver Propagation Delay and Transition Time Test Circuit

Notes:

Note A: All input pulses have frequency = 10MHz, tR or tF = 2ns.

Note B: CL includes all probe and fixture capacitances.

© 2001 Fairchild Semiconductor Corporation

FIN1017 • Rev. 1.0.3

Figure 5. AC Waveforms

5

www.fairchildsemi.com

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