FIN1017 Просмотр технического описания (PDF) - ON Semiconductor

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FIN1017

3.3V LVDS, 1-Bit, High-Speed Differential Driver

ON Semiconductor 

DC Electrical Characteristics

Over-supply voltage and operating temperature ranges, unless otherwise specified. All typical values are at TA =

25°C and with VCC = 3.3V.

Symbol

Parameter

VOD

ΔVOD

Output Differential Voltage

VOD Magnitude Change from

Differential LOW-to-HIGH

VOS

ΔVOS

Offset Voltage

Offset Magnitude Change from

Differential LOW-to-HIGH

IOFF Power-Off Output Current

IOS Short-Circuit Output Current

VIH

VIL

IIN

II(OFF)

VIK

Input HIGH Voltage

Input LOW Voltage

Input Current

Power-Off Input Current

Input Clamp Voltage

ICC Power Supply Current

CIN

COUT

Input Capacitance

Output Capacitance

Conditions

RL = 100 Ω, See Figure 3

VCC = 0V, VOUT = 0V or 3.6V

VOUT = 0V

VOD = 0V

VIN = 0V or VCC

VCC = 0V, VIN = 0V or 3.6V

IIK = -18mA

No Load, VIN = 0V or VCC

RL = 100Ω, VIN = 0V or VCC

Min. Typ. Max. Units

250 350 450 mV

25

mV

1.125 1.250 1.375 V

25

mV

2

GND

-1.5

4

6

±20 mA

-8

mA

±8

VCC

V

0.8

V

±20 mA

±20 mA

V

8

mA

10

mA

pF

pF

AC Electrical Characteristics

Over-supply voltage and operating temperature ranges, unless otherwise specified. All typical values are at TA =

25°C and with VCC = 3.3V.

Symbol

Parameter

Test Conditions

Min. Max. Units

tPLHD Differential Propagation Delay, LOW-to-HIGH

0.5 1.5 ns

tPHLD Differential Propagation Delay, HIGH-to-LOW

0.5 1.5 ns

tTLHD

tTHLD

Differential Output Rise Time (20% to 80%)

Differential Output Fall Time (80% to 20%)

RL = 100Ω, CL = 10pF,

see Figure 4 and Figure 5

0.4 1.0 ns

0.4 1.0 ns

tSK(P)

tSK(PP)

Pulse Skew |tPLH - tPHL|

Part-to-Part Skew(2)

0.5 ns

1.0 ns

Note:

2. tSK(PP) is the magnitude of the difference in propagation delay times between any specified terminals of two

devices switching in the same direction (either LOW-to-HIGH or HIGH-to-LOW) when both devices operate with

the same supply voltage, same temperature, and have identical test circuits.

© 2001 Fairchild Semiconductor Corporation

FIN1017 • Rev. 1.0.3

4

www.fairchildsemi.com

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