74HC132-Q100 Просмотр технического описания (PDF) - NXP Semiconductors.

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производитель

74HC132-Q100

Quad 2-input NAND Schmitt trigger

NXP Semiconductors. 

Nexperia

74HC132-Q100; 74HCT132-Q100

Quad 2-input NAND Schmitt trigger

VI 90 %

negative

pulse

GND

VI

positive

pulse

GND 10 %

VM

10 %

tf

tr

90 %

VM

G

VI

RT

tW

tW

VCC

DUT

VM

tr

tf

VM

VO

CL

001aah768

Test data is given in Table 9.

Definitions test circuit:

RT = termination resistance should be equal to output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

Figure 7. Test circuit for measuring switching times

Table 9. Test data

Type

74HC132-Q100

74HCT132-Q100

Input

VI

VCC

3.0 V

tr, tf

6.0 ns

6.0 ns

Load

CL

15 pF, 50 pF

15 pF, 50 pF

Test

tPLH, tPHL

tPLH, tPHL

74HC_HCT132_Q100

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 4 — 12 June 2018

© Nexperia B.V. 2018. All rights reserved.

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