HI1175-EV Просмотр технического описания (PDF) - Renesas Electronics
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HI1175-EV Datasheet PDF : 13 Pages
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HI1175
Test Circuits (Continued)
2.6V
fC -1kHz
SG
0.6V
1
2
AMP
VIN DUT
HI1175
NTSC
SIGNAL
40 IRE
SOURCE 100 MODULATION
2.6V
IRE
0
-40
BURST
SYNC
0.6V
SG
(CW) fC
8 TTL
ECL
TTL
ECL
HI20201
8
10-BIT
1
D/A
2
620
CLK
-5.2V
620
-5.2V
ERROR RATE
HPF
COUNTER
VECTOR
SCOPE
DG
DP
FIGURE 22. MAXIMUM OPERATIONAL SPEED AND DIFFERENTIAL GAIN AND PHASE ERROR TEST CIRCUIT
2.6V
0.6V
VDD
VRT
VIN
VRB
HI1175
CLK
OE
GND
IOL
VOL
+
-
2.6V
0.6V
VDD
VRT
VIN
VRB
HI1175
CLK
OE
GND
IOH
VOH
+
-
ICL8069
REFERENCE
FIGURE 23. DIGITAL OUTPUT CURRENT TEST CIRCUIT
AMP
A/D
DSP/P
D/A
AMP
HA5020 (Single)
HA5022(Dual)
HA5024 (Quad)
HA5013 (Triple)
HI1175 (8-Bit)
HSP9501
HSP48901
HSP43881
HSP43168
HI3338 (8-Bit)
HI1171 (8-Bit)
HSP9501: Programmable Data Buffer
HSP48901: 3 x 3 Image Filter, 30MHz, 8-Bit
HSP43881: Digital Filter, 30MHz, 1-D and 2-D FIR Filters
HSP43168: Dual FIR Filter, 10-Bit, 33MHz/45MHz
CMOS Logic Available in HC, HCT, AC, ACT and FCT.
HA5013: Triple, 125MHz, IOUT = 20mA
HA5020: Single, 100MHz, IOUT = 30mA, Output Enable/Disable
HA5022: Dual, 125MHz, IOUT = 20mA, Output Enable/Disable
HA5024: Quad, 125MHz, IOUT = 20mA, Output Enable/Disable
FIGURE 24. 8-BIT SYSTEM COMPONENTS
HA5020 (Single)
FN3577 Rev 8.00
October 25, 2005
Page 11 of 13
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