DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

AN4506 Просмотр технического описания (PDF) - STMicroelectronics

Номер в каталоге
Компоненты Описание
производитель
AN4506 Datasheet PDF : 47 Pages
First Prev 21 22 23 24 25 26 27 28 29 30 Next Last
AN4506
Interrupt generation
5.2
Interrupt configuration
The L3GD20H offers several possibilities to personalize the interrupt signal. The registers
involved in the interrupt generation behavior are IG_CFG, IG_THS and IG_DURATION.
AND/OR
LIR
Table 18. IG_CFG register
ZHIE
ZLIE
YHIE
YLIE
XHIE
XLIE
AND/OR
LIR
ZHIE
ZLIE
YHIE
YLIE
XHIE
XLIE
Table 19. IG_CFG description
AND/OR combination of interrupt events. Default value: 0
(0: OR combination of interrupt events 1: AND combination of interrupt events
Latch interrupt request. Default value: 0
(0: interrupt request not latched; 1: interrupt request latched)
Cleared by reading IG_SRC reg.
Enable interrupt generation on Z high event. Default value: 0
(0: disable interrupt request; 1: enable interrupt request on measured rate value
higher than preset threshold)
Enable interrupt generation on Z low event. Default value: 0
(0: disable interrupt request; 1: enable interrupt request on measured rate value lower
than preset threshold)
Enable interrupt generation on Y high event. Default value: 0
(0: disable interrupt request; 1: enable interrupt request on measured rate value
higher than preset threshold)
Enable interrupt generation on Y low event. Default value: 0
(0: disable interrupt request; 1: enable interrupt request on measured rate value lower
than preset threshold)
Enable interrupt generation on X high event. Default value: 0
(0: disable interrupt request; 1: enable interrupt request on measured rate value
higher than preset threshold)
Enable interrupt generation on X low event. Default value: 0
(0: disable interrupt request; 1: enable interrupt request on measured rate value lower
than preset threshold)
AND/OR
0
1
Table 20. Interrupt mode configuration
Interrupt mode
OR combination of interrupt events
AND combination of interrupt events
Whenever an interrupt condition is verified the interrupt signal is generated and by reading
the IG_SRC register it is possible to understand which condition happened.
Reading IG_SRC also clears the IG_SRC IA bit (and eventually the interrupt signal on the
INT1 pin) and allows the refresh of data in the IG_SRC register if the latched option was
chosen.
DocID026442 Rev 2
23/47

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]