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SPT7721 Просмотр технического описания (PDF) - Signal Processing Technologies

Номер в каталоге
Компоненты Описание
производитель
SPT7721
SPT
Signal Processing Technologies SPT
SPT7721 Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
ELECTRICAL SPECIFICATIONS
TA = TMIN to TMAX, AVCC = +5.0 V, ƒCLK = 250 MHz, OVDD = 5 V, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
TEST
LEVEL
MIN
Dynamic Performance
Total Harmonic Distortion (THD)
ƒIN = 70 MHz
+25 °C
ƒIN = 70 MHz
–40 °C to +85 °C
Signal-to-Noise and Distortion (SINAD)
ƒIN = 70 MHz
+25 °C
ƒIN = 70 MHz
–40 °C to +85 °C
VI
IV
VI
37
IV
35
Power Supply Requirements
AVCC Voltage (Analog Supply)
OVDD Voltage (Digital Supply)
AVCC Current
Power Dissipation with Internal Voltage Reference
Power Supply Rejection Ratio
IV
4.75
IV
2.75
VI
VI
V
SPT7721
TYP
–43
–41
39
37
5.0
62
310
35
Common Mode Reference
Voltage
Voltage Tempco
Output Impedance
Current Capability
Power Supply Rejection Ratio
Clock and Reset Inputs (Differential and Single-Ended)
Differential Signal Amplitude VDIFF
Differential High Input Voltage VIHD
Differential Low Input Voltage VILD
Differential Common-Mode Input VCMD
Single-Ended High Input Voltage VIH
Single-Ended Low Input Voltage VIL
High Current Level VID <2.5 V
Low Current Level VID
Power Down and Mode Control Inputs (Single-Ended)
High Input Voltage
Low Input Voltage
Maximum Input Current Low
Maximum Input Current High <4.0 V
VI
2.45
2.5
V
119
V
1
V
50
V
34
VI
400
IV
1.7
IV
0
IV
1.5
IV
1.8
IV
0
VI
–100
20
VI
–100
20
IV
2.0
IV
0
VI
–100
10
VI
–100
10
Digital Outputs
Logic "1" Voltage (IOH = –100 µA)
Logic "0" Voltage (IOL = +100 µA)
TR/TF Data (10 pF load)
TR/TF DCLK = (10 pF load)
VI
OVDD – 0.2
VI
V
3
V
1.5
MAX UNITS
–40 dB
–37 dB
dB
dB
5.25 V
5.25 V
70
mA
350 mW
mV/V
2.55 V
ppm/°C
k
µA
mV/V
AVCC
AVCC –0.4
1.2
+100
+100
mVP-P
V
V
V
V
V
µA
µA
AVCC V
1.0
V
+100 µA
+100 µA
V
0.2
V
ns
ns
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is guaranteed
over specified temperature range.
SPT
3
SPT7721
2/20/01

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