NXP Semiconductors
PXT2907A
60 V, 600 mA, PNP switching transistor
11. Test information
- IB
90 %
10 %
- IC
90 %
- IBon (100 %)
input pulse
(idealized waveform)
- IBoff
output pulse
(idealized waveform)
- IC (100 %)
10 %
td
tr
t on
Fig. 11. BISS transistor switching time definition
VBB
VCC
ts
t off
t
tf
006aaa266
oscilloscope (probe)
450 Ω
VI
RB
R2
R1
Fig. 12. Test circuit for switching times
RC
Vo (probe)
oscilloscope
450 Ω
DUT
mgd624
11.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
PXT2907A
Product data sheet
All information provided in this document is subject to legal disclaimers.
3 August 2015
© NXP Semiconductors N.V. 2015. All rights reserved
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