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AON7520_REV_A Просмотр технического описания (PDF) - Alpha and Omega Semiconductor

Номер в каталоге
Компоненты Описание
производитель
AON7520_REV_A
AOSMD
Alpha and Omega Semiconductor AOSMD
AON7520_REV_A Datasheet PDF : 3 Pages
1 2 3
III. Result of Reliability Stress for AON7520
Test Item
Test Condition
MSL
Precondition
168hr 85°c
/85%RH +3 cycle
reflow@260°c
Time
Point
-
Lot
Attribution
12 lots
Total
Sample
size
2618pcs
Number
of
Failures
0
Standard
JESD22-
A113
HTGB
Temp = 150 c,
Vgs=100% of
Vgsmax
168hrs
500 hrs
1000 hrs
3 lots
4 lots
3 lots
770pcs
0
JESD22-
A108
HTRB
77pcs / lot
Temp = 150 c,
168hrs
3 lots
770pcs
0
Vds=80% of
500 hrs
4 lots
Vdsmax
1000 hrs
3 lots
JESD22-
A108
HAST
Pressure Pot
130 c, 85%RH,
33.3 psi, Vds =
80% of Vdsmax
121c, 29.7psi,
RH=100%
96 hrs
96 hrs
77pcs / lot
11 lots 847pcs
0
(Note A*) 77 pcs / lot
11 lots 847pcs
0
JESD22-
A110
JESD22-
A102
(Note A*) 77 pcs / lot
Temperature -65c to 150c,
250 / 500
12 lots 924pcs
0
Cycle
air to air
cycles
JESD22-
A104
(Note A*) 77 pcs / lot
Note A: The reliability data presents total of available generic data up to the published date.
IV. Reliability Evaluation
FIT rate (per billion): 4.16
MTTF = 27446 years
The presentation of FIT rate for the individual product reliability is restricted by the actual
burn-in sample size of the selected product (AON7520). Failure Rate Determination is based
on JEDEC Standard JESD 85. FIT means one failure per billion hours.
Failure Rate = Chi2 x 109 / [2 (N) (H) (Af)]
= 1.83 x 109 / [2x (6x77x168 +8x77x500 +6x77x1000) x259] = 4.16
MTTF = 109 / FIT = 2.40 x 108hrs = 27446 years
Chi²= Chi Squared Distribution, determined by the number of failures and confidence interval
N = Total Number of units from HTRB and HTGB tests
H = Duration of HTRB/HTGB testing
Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C)
Acceleration Factor [Af] = Exp [Ea / k (1/Tj u 1/Tj s)]
Acceleration Factor ratio list:
55 deg C 70 deg C 85 deg C 100 deg C 115 deg C 130 deg C 150 deg C
Af
259
88
32
13
5.64
2.59
1
Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16
Tj u = The use junction temperature in degree (Kelvin), K = C+273.16
K = Boltzmann’s constant, 8.617164 X 10-5eV / K

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