BU2879AK Просмотр технического описания (PDF) - ROHM Semiconductor
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BU2879AK Datasheet PDF : 5 Pages
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Standard ICs
•Measurement circuits
A
VEE
VDD
1000p
OSC
VSS
Fig.1
BU2879AK
VEE
VDD
n = Test pin
nA
VSS
V
Fig.2
1000p
VEE
OSC
VDD
G1
VSS
Monitor
VEE
VDD
VSS
Fig.3
Fig.4
•Electrical characteristic curves
3.8
3.7
3.6
3.5
3.4
3.3
3.2
– 25
25
75
TEMPERATURE: Ta (°C)
Fig. 5 Supply current
temperature characteristics
54
50
46
42
38
34
30
– 25
25
75
TEMPERATURE: Ta (°C)
Fig. 6 “H” grid output current
temperature characteristics
16
15
14
13
12
11
10
– 25
25
75
TEMPERATURE: Ta (°C)
Fig.7 “H” segment output current
temperature characteristics
4
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