FM24CL64B-GA Просмотр технического описания (PDF) - Cypress Semiconductor
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FM24CL64B-GA Datasheet PDF : 13 Pages
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AC Test Conditions
Input Pulse Levels
Input rise and fall times
Input and output timing levels
0.1 VDD to 0.9 VDD
10 ns
0.5 VDD
Diagram Notes
All start and stop timing parameters apply to both read and write cycles.
Clock specifications are identical for read and write cycles. Write
timing parameters apply to slave address, word address, and write data
bits. Functional relationships are illustrated in the relevant datasheet
sections. These diagrams illustrate the timing parameters only.
FM24CL64B - Automotive Temp.
Equivalent AC Test Load Circuit
3.6V
Output
1.8 Kohm
100 pF
Read Bus Timing
SCL
tR
tHIGH
` tF
tLOW
tSP
tSP
t SU:SDA
tBUF
SDA
1/f SCL
tHD:DAT
tSU:DAT
Start
Stop Start
tAA
tDH
Acknowledge
Write Bus Timing
SCL
SDA
tSU:STO
tHD:DAT
tHD:STA
tSU:DAT
tAA
Start
Stop Start
Acknowledge
Data Retention (VDD = 3.0V to 3.6V)
Parameter
Min
Max
Units
Notes
Data Retention
@ TA = +55 C
@ TA = +105 C
@ TA = +125 C
17
10,000
1,000
-
Years
-
Hours
-
Hours
Note : Data retention qualification tests are accelerated tests and are performed such that all three conditions have been applied :
(1) 17 years at a temperature of +55 C, (2) 10,000 hours at +105 C, and (3) 1,000 hours at +125 C.
Typical Grade 1 Operating Profile
Typical Grade 1 Storage Profile
1600
1400
1200
1000
800
600
400
200
0
70 75 80 85 90 95 100 105 110 115 120 125
Temperature (°C)
25000
20000
15000
10000
5000
0
0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80
Temperature (°C)
Document Number: 001-84457 Rev. *A
Page 10 of 13
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