NE1617ADS,118 Просмотр технического описания (PDF) - NXP Semiconductors.
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NE1617ADS,118 Datasheet PDF : 30 Pages
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NXP Semiconductors
NE1617A
Temperature monitor for microprocessor systems
11.1 Typical performance curves
20
temp.
error
(°C)
10
D+ to GND
002aab749
6
temp.
error
(°C)
2
002aab747
0
−2
−10
D+ to VDD
−20
1
10
102
leakage resistance (MΩ)
−6
1
10
102
103
104
f (kHz)
Fig 7.
Temperature error versus printed-circuit board
leakage resistance
Fig 8.
VI = 100 mVpp and AC-coupled to D
Temperature error versus common-mode
noise frequency
6
temp.
error
(°C)
2
002aab748
10
temp.
error
(°C)
0
002aab750
−2
−10
−6
1
10
102
103
104
f (kHz)
Fig 9.
VI = 100 mVpp and AC-coupled to D and D+
Temperature error versus differential mode
noise frequency
−20
0
40
80
120
D+ to D− capacitance (nF)
Fig 10. Temperature error versus D+ to D
capacitance
NE1617A
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5 — 20 March 2012
© NXP B.V. 2012. All rights reserved.
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