HCPL-7851-300 Просмотр технического описания (PDF) - Broadcom Corporation

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HCPL-7851-300

Hermetically Sealed Analog Isolation Amplifier

Broadcom Corporation 

ACPL-785E, HCPL-7850, HCPL-7851, 5962-97557

Data Sheet

AC Electrical Specifications

AC Electrical Specifications

Over recommended operating conditions (TA = –55°C to +125°C, VIN+ = 0V, VIN– = 0V, VDD1 = 5V and VDD2 = 5V, unless otherwise

specified).

Parameter

Symbol Group Aa

Min

Subgroups

Typb

Max

Unit

Test Conditions

Fig Notes

Common-Mode Rejection CMR

9

5

Propagation Delay to 50% tPD50 9, 10, 11

—

Propagation Delay to 90% tPD90 9, 10, 11

—

Rise/Fall Time (10% to 90%) tR/F

9, 10, 11

—

Small-Signal Bandwidth

(–3 dB)

f–3 dB

9, 10, 11

45

Small-Signal Bandwidth

f–45°

—

(–45°)

RMS Input-Referred Noise

VN

—

Power Supply Rejection

PSR

—

8

5.0 kV/μs

VCM = 1 kV

17

c, d

4.5V ≤ (VDD1, VDD2) ≤ 5.5V,

TA = 25° C

3.7

7.5

μs

VIN+ = 0 to 100 mV step 18, 19

5.7

11.0

4.5V ≤ (VDD1, VDD2) ≤ 5.5V

3.4

7.5

100

—

kHz 4.5V ≤ (VDD1, VDD2) ≤ 5.5V 18, 20, e

VIN+ = 200 mVpk-pk

21

31

—

0.6

—

mVrms

570

—

mVP-P

In recommended

application circuit

22, 24 f

g

a. Commercial parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD, Class H and Class E receive 100% testing at 25, 125, and –55°C (Subgroups 1 and 9,

2 and 10, 3 and 11, respectively).

b. All typicals are at the nominal operating conditions of VIN+ = 0V, VIN– = 0V, TA = 25°C, VDD1 = 5V and VDD2 = 5V.

c. CMR (also known as IMR or Isolation Mode Rejection) specifies the minimum rate of rise of a common-mode signal applied across the isolation boundary at

which small output perturbations begin to occur. These output perturbations can occur with both the rising and falling edges of the common-mode

waveform and may be of either polarity. A CMR failure is defined as a perturbation exceeding 200 mV at the output of the recommended application circuit

(Figure 24). See Applications for more information on CMR.

d. Parameters are tested as part of device initial characterization and after design and process changes only. Parameters are guaranteed to limits specified for

all lots not specifically tested.

e. The f–3dB test is guaranteed by the TRISE test.

f. Output noise comes from two primary sources: chopper noise and sigma-delta quantization noise. Chopper noise results from chopper stabilization of the

output op-amps. It occurs at a specific frequency (typically 500 kHz) and is not attenuated by the on-chip output filter. The on-chip filter does eliminate most,

but not all, of the sigma-delta quantization noise. An external filter circuit may be easily added to the external post-amplifier to reduce the total RMS output

noise. See Applications for more information.

g. Data sheet value is the amplitude of the transient at the differential output of the device when a 1 VP-P, 1 MHz square wave with 100 ns rise and fall times

(measured at pins 1 and 8) is applied to both VDD1 and VDD2.

Broadcom

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