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FSFR2000 Просмотр технического описания (PDF) - Fairchild Semiconductor

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FSFR2000 Datasheet PDF : 16 Pages
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Electrical Characteristics (Continued)
TA=25°C unless otherwise specified.
Symbol
Parameter
Test Conditions
Specifications
Unit
Min Typ Max
Protection Section
IOLP OLP Delay Current
VCON=4V
3.6 4.8 6.0 μA
VOLP OLP Protection Voltage
VCON > 3.5V
4.5 5.0 5.5 V
VOVP L-Vcc Over-Voltage Protection
L-Vcc > 21V
21
23
25
V
VAOCP
TBAO
AOCP Threshold Voltage
AOCP Blanking Time(6)
ΔV/Δt=-1V/µs
-1.0 -0.9 -0.8 V
VCS < VOCP; ΔV/Δt=-1V/us
50
ns
VOCP OCP Threshold Voltage
(V/(t=-1V/µs; VFB=L_Vcc -0.64 -0.58 -0.52 V
TBO OCP Blanking Time(6)
VCS < VOCP;
ΔV/Δt=-1V/µs; VFB=L_VCC
1.0
1.5
2.0 μs
TDA
Delay Time (Low Side) Detecting from VAOCP
to Switch Off(6)
ΔV/Δt=-1V/µs
TSD Thermal Shutdown Temperature(6)
250 400 ns
110 130 150 °C
ISU
Protection Latch Sustain L-Vcc Supply
Current
L-Vcc=7.5V
100 150 μA
VPRSET Protection Latch Reset L-Vcc Supply Voltage
5
V
Dead-Time Control Section
DT
Dead Time(7)
350
ns
Notes:
6. These parameters, although guaranteed, are not tested in production.
7. These parameters, although guaranteed, are tested only in EDS (wafer test) process.
© 2007 Fairchild Semiconductor Corporation
FSFR2100 • 1.0.0
6
www.fairchildsemi.com

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