FIS1100 Просмотр технического описания (PDF) - Fairchild Semiconductor
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производитель
FIS1100
Fairchild Semiconductor
FIS1100 Datasheet PDF : 55 Pages
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3 System, Electrical and Electro-Mechanical Characteristics
3.1 Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions. Stressing the parts to these levels is not recommended. In
addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Table 4. Absolute Maximum Ratings
Symbol
Parameter
Min.
Max. Unit
TSTG
TPmax
VDDa
VDDd
Sg(5)
ESD(6)
Storage Temperature
Lead Soldering Temperature, 10 Seconds
Supply Voltage
I/O Pins Supply Voltage
Acceleration g for 0.2 ms (Un-powered)
Electrostatic Discharge Human Body Model per JES001-2014
Protection Level
Charged Device Model per JESD22-C101
-40
+125
°C
+260
°C
-0.3
3.6
V
-0.3
2.05
V
10,000
g
±2000
V
±500
Notes:
5. This is a mechanical shock (g) sensitive device. Proper handling is required to prevent damage to the part.
6. This is an ESD-sensitive device. Proper handling is required to prevent damage to the part.
3.2 Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance. Fairchild does not recommend exceeding them or
designing to Absolute Maximum Ratings.
Table 5. Recommended Operating Conditions
Symbol
VDDa
VDDd
VIL
VIH
VOL
VOH
Parameter
Supply Voltage
I/O Pins Supply Voltage
Digital Low Level Input Voltage
Digital High Level Input Voltage
Digital Low Level Output Voltage
Digital High Level Output Voltage
Min.
2.4
1.62
0.7 *VDDd
0.9 *VDDd
Typ.
2.7
1.80
Max.
3.47
1.98
0.3 *VDDd
0.1 *VDDd
Unit
V
V
V
V
V
V
© 2015 Fairchild Semiconductor Corporation
FIS1100 • Rev. 1.2
11
www.fairchildsemi.com
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