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RG3216P-8252-W-T1 Просмотр технического описания (PDF) - Unspecified

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производитель
RG3216P-8252-W-T1 Datasheet PDF : 3 Pages
1 2 3
Reliability specification
Test Items
Short time overload
Condition (test methods)
2.5 x rated voltage*,1 5 seconds
Life (biased)
70℃, rated voltage*,1 90min on 30min off, 1000hours
Low
≦47Ω ≧47Ω
Regular
≦47Ω ≧47Ω
High
≦47Ω ≧47Ω
Typical
Low
±0.10% ±0.05% ±0.10% ±0.05%
±0.10% ±(0.01%)
±0.25% ±0.10% ±0.50% ±0.25%
±0.50% ±(0.01%)
High temperature
high humidity
85℃, 85%RH, 1/10 of rated power,
90min on 30min off, 1000hours
±0.25% ±0.10% ±0.50% ±0.25%
±0.50% ±(0.05%)
Temperature shock -55℃ (30min) 〜 125℃ (30min) 1000cycles
±0.25% ±0.10% ±0.25% ±0.10%
±0.10% ±(0.01%)
High temperature
exposure
155℃, no bias, 1000hours
±0.25% ±0.10% ±0.25% ±0.10%
±0.10% ±(0.01%)
Resistance to
soldering heat
260±5℃, 10 seconds (reflow)
±0.1% ±0.1% ±0.1% ±0.1%
±0.1% ±(0.01%)
*1 Rated voltage is given by E= R x P E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)
If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.
10000 hour reliability test data
Biased life test
0.50
0.40
0.30
0.20
0.10
High temoperature life test (85℃)
Sample : RG1608series
Test
Temperature85℃
conditions: Rated voltage 90 min. on/30min. off
Rated power=0.1W
n=100
0.00
−0.10
−0.20
−0.30
−0.40
−0.50
10
1kΩ
10kΩ
56kΩ
100kΩ
330kΩ
100
1000
Test duration(h)
3000
10000
Temperature shock
0.50
0.40
0.30
0.20
Temperature shock
Sample : RG1608series
Test
-55℃(30min)→room temp(. 3min)→
conditions: +125℃(30min)→room temp(. 3min)
n=50
0.10
0.00
−0.10
−0.20
−0.30
−0.40
−0.50
10
100
1000
Number of cycles
56kΩ
100kΩ
10000
High temperature high humidity (biased)
0.50
0.40
0.30
0.20
0.10
High temperature high humidity bias (THB 85℃ 85%)
Sample : RG1608series
Test
Temperature85℃ Humidity85%RH
conditions: 1/10 rated power 90min.on/30min. off
Rated power=0.1W
n=100
0.00
−0.10
−0.20
−0.30
−0.40
−0.50
10
1kΩ
10kΩ
56kΩ
100kΩ
330kΩ
100
1000
Test duration(h)
3000
10000
High temperature exposure
High temperature exposure(155℃)
0.50
0.40
0.30
0.20
Sample : RG1608series
Test
Temperature155℃
conditions: n=100
0.10
0.00
−0.10
−0.20
−0.30
−0.40
−0.50
10
1kΩ
10kΩ
56kΩ
100kΩ
330kΩ
100
1000
Test duration(h)
3000
10000
Derating Curve
100
50
High power application
Regular power application
High precision
0
−55
0
70 85
Ambient temperature (℃)
155
Maximum pulse power limit
100
10
1
0.1
0.0001
1005 type
1608 type
2012 type
3216 type
0.001
0.01
0.1
1
Pulse duration (seconds)
Test procedure
Voltage pulse is applied to the test samples mounted
on the test board.
After each pulse, resistance drift is measured. Pulse
voltage is increased until the drift exceeds +/-0.5%.
The power at that voltage is defined as the
10
maximum pulse power.
16

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