USB1T1103MHX(2007) Просмотр технического описания (PDF) - Fairchild Semiconductor

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USB1T1103MHX
(Rev.:2007)

Universal Serial Bus Peripheral Transceiver with Voltage Regulator

Fairchild Semiconductor 

ESD Protection

ESD Performance of the USB1T1103

■ HBM D+/D-: 15.0kV

■ HBM, all other terminals (Mil-Std 883E): 6.5kV

ESD Protection: D+/D- Terminals

Since the differential terminals of a USB transceiver may

be subjected to extreme ESD voltages, additional immu-

nity has been included in the D+ and D- terminals with-

out compromising performance. The USB1T1103

differential terminals have ESD protection to the follow-

ing limits:

■ 15kV using the contact Human Body Model

■ 8kV using the Contact Discharge method as specified

in IEC 61000-4-2

Human Body Model

Figure 3 shows the schematic representation of the

Human Body Model ESD event. Figure 4 is the ideal

waveform representation of the Human Body Model.

IEC 61000-4-2, IEC 60749-26 and IEC 60749-27

The IEC 61000-4-2 standard covers ESD testing and

performance of finished equipment and evaluates the

equipment in its entirety for ESD immunity. Fairchild

Semiconductor has evaluated this device using the

IEC 6100-4-2 representative system model depicted in

Figure 5. Under the additional standards set forth by the

IEC, this device is also compliant with IEC 60749-26

(HBM) and IEC 60749-27 (MM).

Additional ESD Test Conditions

For additional information regarding our product test

methodologies and performance levels, please contact

Fairchild Semiconductor.

Figure 3. Human Body ESD Test Model

Figure 4. HBM Current Waveform

Figure 5. IEC 61000-4-2 ESD Test Model

© 2005 Fairchild Semiconductor Corporation

USB1T1103 Rev. 1.0.3

6

www.fairchildsemi.com

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