MAL214699812E3(2013) Просмотр технического описания (PDF) - Vishay Semiconductors
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Компоненты Описание
производитель
MAL214699812E3
(Rev.:2013)
(Rev.:2013)
Vishay Semiconductors
MAL214699812E3 Datasheet PDF : 11 Pages
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146 CTI
Vishay BCcomponents
Table 8
MULTIPLIER OF RIPPLE CURRENT (IR) AS A FUNCTION OF FREQUENCY
FREQUENCY
(Hz)
UR = 16 V to 25 V
IR MULTIPLIER
UR = 35 V
50
0.60
0.45
100
0.70
0.65
300
0.80
0.80
1000
0.85
0.85
3000
0.90
0.90
10 000
0.95
0.95
30 000
0.97
0.97
100 000
1.00
1.00
UR = 50 V TO 63 V
0.40
0.60
0.75
0.82
0.90
0.95
0.97
1.00
Table 9
TEST PROCEDURES AND REQUIREMENTS
TEST
NAME OF TEST
REFERENCE
PROCEDURE
(quick reference)
Mounting
IEC 60384-18,
subclause 4.3
Shall be performed prior to tests mentioned below;
reflow soldering;
for maximum temperature load
refer to chapter “Mounting”
Endurance
IEC 60384-18/
CECC 32300,
subclause 4.15
Tamb = 125 °C; UR applied;
for test duration see Table 7
Useful life
CECC 30301,
subclause 1.8.1
Tamb = 125 °C; UR and IR applied;
for test duration see Table 7
Shelf life
(storage at high
temperature)
Reverse voltage
IEC 60384-18/
CECC 32300,
subclause 4.17
IEC 60384-18/
CECC 32300,
subclause 4.16
Tamb = 125 °C; no voltage applied;
1000 h
after test: UR to be applied for 30 min,
24 h to 48 h before measurement
Tamb = 125 °C:
125 h at U = -0.5 V,
followed by 125 h at UR
REQUIREMENTS
C/C: ± 5 %
tan spec. limit
IL2 spec. limit
UR 16 V; C/C: ± 20 %
tan 2 x spec. limit
IL2 spec. limit
C/C: ± 30 %
tan 3 x spec. limit
IL2 spec. limit
no short or open circuit
total failure percentage: 1 %
For requirements
see “Endurance test” above
C/C: ± 15 %
tan 1.5 x spec. limit
IL2 spec. limit
Revision: 01-Oct-13
10
Document Number: 28403
For technical questions, contact: aluminumcaps1@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
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