74HC153-Q100(2013) Просмотр технического описания (PDF) - NXP Semiconductors.
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74HC153-Q100 Datasheet PDF : 15 Pages
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NXP Semiconductors
74HC153-Q100; 74HCT153-Q100
Dual 4-input multiplexer
9,
6QQ(LQSXW
*1'
92+
Q<RXWSXW
92/
90
9<
W7+/
W3+/
90
9;
90
W3/+
90
W7/+
DDD
(1) Measurement points are given in Table 8.
VOL and VOH are typical voltage output levels that occur with the output load.
Fig 7. Waveforms showing the input (Sn, nE) to output (nY) propagation delays
VI 90 %
tW
negative
pulse
VM
GND
10 %
tf
tr
VI
90 %
positive
pulse
VM
10 %
GND
tW
VCC
VI
G
DUT
RT
VM
tr
tf
VM
VO
CL
001aah768
Fig 8.
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Test circuit for measuring switching times
Table 9. Test data
Type
74HC153-Q100
74HCT153-Q100
Input
VI
VCC
3.0 V
tr, tf
6.0 ns
6.0 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
Test
tPLH, tPHL
tPLH, tPHL
74HC_HCT153_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 28 November 2013
© NXP B.V. 2013. All rights reserved.
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