74AHCT1G126SE-7 Просмотр технического описания (PDF) - Diodes Incorporated.

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74AHCT1G126SE-7

IC BUS/BUFF 3ST SGL N-INV SOT353

Diodes Incorporated. 

74AHCT1G126

SINGLE BUFFER GATE WITH 3-STATE OUTPUT

Parameter Measurement Information

Under Test

CL

(see Note A)

RL=1 kΩ S1

Vcc

Open

GND

TEST

tPLH/tPHL

tPLZ/tPZL

tPHZ/tPZH

S1

Open

Vload

GND

Vcc

5V±0.5V

5V±0.5V

Inputs

VI

tr/tf

VCC

≤3ns

VCC

≤3ns

VM

VCC/2

VCC/2

CL

15pF

50pF

V∆

0.3V

0.3V

Voltage Waveform Pulse Duration

Voltage Waveform Enable and Disable Times

Low and High Level Enabling

Voltage Waveform Propagation Delay Times

Inverting and Non Inverting Outputs

Figure 1. Load Circuit and Voltage Waveforms

Notes:

A. Includes test lead and test apparatus capacitance.

B. All pulses are supplied at pulse repetition rate ≤ 1 MHz.

C. Inputs are measured separately one transition per measurement.

D. tPLZ and tPHZ are the same as tdis.

E. tPZL and tPZH are the same as tEN.

F. tPLH and tPHL are the same as tPD.

74AHCT1G126

Document number: DS35187Rev. 1 - 2

6 of 9

www.diodes.com

May 2011

© Diodes Incorporated

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