510BCA100M000AAG Просмотр технического описания (PDF) - Silicon Laboratories

Номер в каталоге

Компоненты Описание

производитель

510BCA100M000AAG

CRYSTAL OSCILLATOR (XO) 100 kHZ TO 250 MHZ

Silicon Laboratories 

Si510/511

Table 7. Output Clock Jitter and Phase Noise (CMOS, Dual CMOS (Complementary))

VDD = 1.8 V ±5%, 2.5 or 3.3 V ±10%, TA = –40 to +85 oC; Output Format = CMOS, Dual CMOS (Complementary)

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Phase Jitter

(RMS)

φJ

1.875 MHz to 20 MHz integration

—

0.25

0.35

ps

bandwidth2 (brickwall)

Phase Noise,

156.25 MHz

12 kHz to 20 MHz integration band-

—

width2 (brickwall)

φN

100 Hz

—

1 kHz

—

0.8

–86

–108

1.0

ps

—

dBc/Hz

—

dBc/Hz

10 kHz

—

–115

—

dBc/Hz

100 kHz

—

–123

—

dBc/Hz

Spurious

SPR

1 MHz

LVPECL output, 156.25 MHz,

offset>10 kHz

—

–136

—

dBc/Hz

—

–75

—

dBc

Notes:

1. Applies to output frequencies: 74.17582, 74.25, 75, 77.76, 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25,

212.5 MHz.

2. Applies to output frequencies: 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25, 212.5 MHz.

Table 8. Environmental Compliance and Package Information

Mechanical Shock

Parameter

Mechanical Vibration

Solderability

Gross and Fine Leak

Resistance to Solder Heat

Contact Pads

Conditions/Test Method

MIL-STD-883, Method 2002

MIL-STD-883, Method 2007

MIL-STD-883, Method 2003

MIL-STD-883, Method 1014

MIL-STD-883, Method 2036

Gold over Nickel

Rev. 1.4

9

Share Link: