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13N80K5 Просмотр технического описания (PDF) - STMicroelectronics

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13N80K5 Datasheet PDF : 13 Pages
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STFI13N80K5
Electrical characteristics
Table 6. Switching times
Symbol
Parameter
Test conditions
td(on)
tr
td(off)
tf
Turn-on delay time
Rise time
Turn-off delay time
Fall time
VDD = 400 V, ID = 6A,
RG=4.7 , VGS=10 V
(see Figure 18)
Min. Typ. Max. Unit
-
16
-
ns
-
16
-
ns
-
42
-
ns
-
16
-
ns
Table 7. Source drain diode
Symbol
Parameter
Test conditions
ISD Source-drain current
ISDM
VSD(1)
Source-drain current (pulsed)
Forward on voltage
VGS=0, ISD= 12 A
trr
Qrr
IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD= 12 A, VDD= 60 V
di/dt = 100 A/µs,
(see Figure 17)
trr
Qrr
IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD= 12 A,VDD= 60 V
di/dt=100 A/µs,
Tj=150 °C
(see Figure 17)
1. Pulsed: pulse duration = 300 µs, duty cycle 1.5%
Min. Typ. Max. Unit
-
14 A
-
56 A
-
1.5 V
- 406
ns
- 5.7
µC
- 28
A
- 600
ns
- 7.9
µC
- 26
A
Table 8. Gate-source Zener diode
Symbol
Parameter
Test conditions
Min. Typ. Max. Unit
V(BR)GSO Gate-source breakdown voltage IGS= ± 1mA, ID= 0
30 -
-
V
The built-in back-to-back Zener diodes have been specifically designed to enhance the ESD
capability of the device. The Zener voltage is appropriate for efficient and cost-effective
intervention to protect the device integrity. These integrated Zener diodes thus eliminate the
need for external components.
DocID027200 Rev 2
5/13

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