MAX8863
ABSOLUTE MAXIMUM RATINGS*
Rating
Symbol
Value
Unit
Input Voltage
–
6.5
V
Output Short–Circuit Duration
–
Infinite
–
SET to GND
–
– 0.3 to +6.5
V
SHDN to GND
–
– 6.5 to + 6.5
V
SHDN to IN
–
–6.5 to + 0.3
V
Output Voltage
Continuous Power Dissipation (TA = +70°C)
SOT–23–5 (Derate 7.1 mW/°C above +70°C)
–
–0.3 to VIN + 0.3
V
–
571
mW
Operating Temperature Range
Storage Temperature Range
Lead Temperature (Soldering, 10 Sec.)
TA
–40 to 85
°C
Tstg
–65 to +160
°C
–
+300
°C
ESD Withstand Voltage
Human Body Model (Note 1.)
VESD
u2000
V
Latch–Up Performance (Note 2.)
Positive
Negative
ILATCH–UP
mA
420
240
*Stresses above those listed under “Absolute Maximum Ratings’’ may cause permanent damage to the device. These are stress ratings only
and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications
is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS (VIN = +3.6 V, GND = 0 V, TA = TMIN to TMAX, unless otherwise specified. Typical values are at
TA = +25°C.) (Note 3.)
Characteristics
Test Conditions
Symbol
Min
Typ
Max
Unit
Input Voltage (Note 4.)
Output Voltage
VOUT w 2.5 V
VOUT = 1.8 V
VIN
VOUT + 0.5 V
–
2.7
–
6.0
V
6.0
0 mA v IOUT v 50 mA
T
S
R
Q
VOUT
3.05
2.75
2.70
1.745
V
3.15
3.25
2.84
2.93
2.80
2.88
1.80
1.85
Maximum Output Current
–
IOUT
120
–
–
mA
Current Limit (Note 5.)
–
ILIM
–
280
–
mA
Input Current
IOUT = 0
IIN
–
50
90
µA
Dropout Voltage (Note 6.)
IOUT = 1.0 mA
IOUT = 50 mA
IOUT = 100 mA
–
–
1.1
–
mV
–
55
120
–
110
240
Line Regulation
VIN = VOUT + 0.5 V to 6.0 V
IOUT = 1.0 mA
DVLNR
–0.10
–
.001
0.10
%/V
–
–
Load Regulation
IOUT = 0 mA to 50 mA
DVLDR
–
0.01
0.040
%/mA
Output Voltage Noise
10 Hz to 1.0 MHz
COUT = 1.0 µF
COUT = 100 µF
–
µVRMS
–
350
–
–
220
–
Wake Up Time
VIN = 3.6 V
tWK
–
10
–
µsec
CIN = 1.0 µF, COUT = 1.0 µF
(from Shutdown Mode)
IL = 30 mA, (See Fig. 1)
Settling Time
(from Shutdown Mode)
VIN = 3.6 V
tS
CIN = 1.0 µF, COUT = 1.0 µF
IL = 30 mA, (See Fig. 1)
–
140
–
µsec
1. Tested to EIA/JESD22–A114–A
2. Tested to EIA/JESD78
3. Limits are 100% production tested at TA = +25°C. Limits over the operating temperature range are guaranteed through correlation using
Statistical Quality Control (SQC) Methods.
4. Guaranteed by line regulation test.
5. Not tested. For design purposes, the current limit should be considered 150 mA minimum to 410 mA maximum.
6. The dropout voltage is defined as (VIN – VOUT) when VOUT is 100 mV below the value of VOUT for VIN = VOUT + 2.0 V.
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