3D7110 Просмотр технического описания (PDF) - Data Delay Devices

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3D7110

MONOLITHIC 10-TAP FIXED DELAY LINE

Data Delay Devices 

3D7110

SILICON DELAY LINE AUTOMATED TESTING

TEST CONDITIONS

INPUT:

Ambient Temperature: 25oC ± 3oC

Supply Voltage (Vcc): 5.0V ± 0.1V

Input Pulse:

High = 3.0V ± 0.1V

Low = 0.0V ± 0.1V

Source Impedance: 50Ω Max.

Rise/Fall Time:

3.0 ns Max. (measured

between 0.6V and 2.4V

)

Pulse Width:

Delay

PWIN = 1.25 x Total

Period:

Delay

PERIN = 2.5 x Total

Device

Under

Test

OUTPUT:

Rload:

Cload:

Threshold:

10KΩ

470Ω

10KΩ ± 10%

5pf ± 10%

1.5V (Rising & Falling)

Digital

Scope

5pf

COMPUTER

SYSTEM

PRINTER

PULSE

GENERATOR

OUT

TRIG

OUT1

OUT2

DEVICE UNDER OUT3

IN

TEST (DUT)

OUT4

OUT5

OUT6

OUT7

OUT8

OUT9

OUT10

REF

IN

DIGITAL SCOPE/

TRIG TIME INTERVAL COUNTER

Figure 2: Test Setup

NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.

tRISE

PWIN

PERIN

tFALL

INPUT

SIGNAL

2.4V

VIH

1.5V

0.6V

tPLH

2.4V

1.5V

0.6V

VIL

tPHL

OUTPUT

SIGNAL

1.5V

VOH

1.5V

VOL

Figure 3: Timing Diagram

Doc #96005

DATA DELAY DEVICES, INC.

5

12/2/96

3 Mt. Prospect Ave. Clifton, NJ 07013

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