IDT70T659S008DRI Просмотр технического описания (PDF) - Integrated Device Technology

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производитель

IDT70T659S008DRI

HIGH-SPEED 2.5V 256/128K x 36 ASYNCHRONOUS DUAL-PORT STATIC RAM WITH 3.3V 0R 2.5V INTERFACE

Integrated Device Technology 

IDT70T651/9S

High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM

AC Test Conditions (VDDQ - 3.3V/2.5V)

Input Pulse Levels

GND to 3.0V / GND to 2.4V

Input Rise/Fall Times

2ns Max.

Input Timing Reference Levels

1.5V/1.25V

Output Reference Levels

1.5V/1.25V

Output Load

Figure 1

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Preliminary

Industrial and Commercial Temperature Ranges

DATAOUT

50Ω

50Ω

10pF

(Tester)

Figure 1. AC Output Test load.

,

1.5V/1.25

5632 drw 03

∆ tAA/tACE

(Typical, ns)

4

3.5

3

2.5

2

1.5

1

0.5

0

0

20

40

60

80

100

120

140

160

∆ Capacitance (pF) from AC Test Load

5632 drw 05

Figure 3. Typical Output Derating (Lumped Capacitive Load).

10

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