ATF20V8B-25JC Просмотр технического описания (PDF) - Atmel Corporation

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ATF20V8B-25JC

High-performance EE PLD

Atmel Corporation 

ATF20V8B

DC Characteristics

Symbol Parameter

Condition

Min

Typ

Max

IIL

Input or I/O Low

Leakage Current

0 ≤ VIN ≤ VIL(MAX)

-35

-100

IIH

Input or I/O High

Leakage Current

3.5 ≤ VIN ≤ VCC

10

B-7, -10

Com.

Ind.

60

90

60

100

Com.

ICC

Power Supply

Current, Standby

VCC = MAX,

VIN = MAX,

Outputs Open

B-15, -25

Ind.

BQ-10

Com.

60

80

60

90

35

55

Com.

BQL-15, -25

Ind.

5

10

5

15

Clocked Power

Supply Current

ICC2

VCC = MAX,

Outputs Open,

f = 15 MHz

B-7, -10

B-15, -25

BQ-10

Com.

Ind.

Com.

Ind.

Com.

80

110

80

125

60

90

60

105

40

55

Com.

BQL-15, -25

Ind.

20

35

20

40

IOS(1)

Output Short

Circuit Current

VOUT = 0.5V

-130

VIL

VIH

VOL

VOH

Note:

Input Low Voltage

-0.5

0.8

Input High Voltage

2.0

VCC + 0.75

Output Low Voltage

VIN = VIH or VIL,

VCC = MIN

IOL = 24 mA

Com.,

Ind.

0.5

IOL = 16 mA

0.5

Output High Voltage

VIN = VIH or VIL,

VCC = MIN

IOH = -4.0 mA

2.4

1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.

Units

µA

µA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

V

V

V

V

V

3

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