M28C17-25NS6T Просмотр технического описания (PDF) - STMicroelectronics
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M28C17-25NS6T Datasheet PDF : 19 Pages
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Table 4. AC Measurement Conditions
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
Note that Output Hi-Z is defined as the point where data is no longer driven.
M28C16A, M28C17A
≤ 20ns
0.4V to 2.4V
0.8V to 2.0V
Figure 5. AC Testing Input Output Waveforms
4.5V to 5.5V Operating Voltage
2.4V
0.4V
2.0V
0.8V
2.7V to 3.6V Operating Voltage
VCC – 0.3V
0V
0.5 VCC
AI02101B
Figure 6. AC Testing Equivalent Load Circuit
VCC
IOL
DEVICE
UNDER
TEST
IOH
OUT
CL = 30pF
CL includes JIG capacitance
AI02114
Table 5. Capacitance (1)
(TA = 25 °C, f = 1 MHz )
Symbol
Parameter
CIN
Input Capacitance
COUT
Output Capacitance
Note: 1. Sampled only, not 100% tested.
Test Condition
VIN = 0V
VOUT = 0V
Min
Max
Unit
6
pF
12
pF
Table 6. Read Mode DC Characteristics for M28C16A and M28C17A
(TA = –40 to 85°C, VCC = 4.5V to 5.5V)
Symbol
Parameter
Test Condition
ILI
Input Leakage Current
ILO
ICC (1)
ICC1 (1)
ICC2 (1)
Output Leakage Current
Supply Current (TTL and CMOS inputs)
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
VIL
Input Low Voltage
VIH
Input High Voltage
VOL Output Low Voltage
VOH Output High Voltage
Note: 1. All I/O’s open circuit.
0V ≤ VIN ≤ VCC
0V ≤ VIN ≤ VCC
E = VIL, G = VIL , f = 5MHz
E = VIH
E > VCC – 0.3V
IOL = 2.1 mA
IOH = –400 µA
Min
–0.3
2
2.4
Max
Unit
10
µA
10
µA
25
mA
1
mA
50
µA
0.8
V
VCC + 0.5
V
0.4
V
V
5/19
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