H30T90 Просмотр технического описания (PDF) - Infineon Technologies

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производитель

H30T90

Soft Switching Series

Infineon Technologies 

Soft Switching Series

IHW30N90T

q

1000ns

td(off)

1µs td(off)

100ns

td(on)

tf

tr

10ns

0A

10A 20A 30A 40A 50A

IC, COLLECTOR CURRENT

Figure 9. Typical switching times as a

function of collector current

(inductive load, TJ=175°C,

VCE=600V, VGE=0/15V, RG=15Ω,

Dynamic test circuit in Figure E)

tf

100ns

td(on)

tr

10Ω 20Ω 30Ω 40Ω 50Ω 60Ω 70Ω

RG, GATE RESISTOR

Figure 10. Typical switching times as a

function of gate resistor

(inductive load, TJ=175°C,

VCE=600V, VGE=0/15V, IC=30A,

Dynamic test circuit in Figure E)

td(off)

100ns

tf

td(on)

tr

10ns

0°C

50°C

100°C

150°C

TJ, JUNCTION TEMPERATURE

Figure 11. Typical switching times as a

function of junction temperature

(inductive load, VCE=600V,

VGE=0/15V, IC=30A, RG=15Ω,

Dynamic test circuit in Figure E)

7V

6V

5V

max.

4V

typ.

3V

min.

2V

-50°C

0°C

50°C 100°C 150°C

TJ, JUNCTION TEMPERATURE

Figure 12. Gate-emitter threshold voltage as

a function of junction temperature

(IC = 0.3mA)

Power Semiconductors

6

Rev. 2.3 Nov 08

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