HA17902FPJ Просмотр технического описания (PDF) - Renesas Electronics
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HA17902FPJ Datasheet PDF : 11 Pages
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HA17902 Series
4. Voltage gain (AVD), slew rate (SR), common-mode input voltage range (VCM), and maximum output voltage
amplitude (VOP-P) test circuit.
Vin
40dB
Rf
100k
47µ
–+
R
51k
VCC
–
D.U.T
+
Vout
Vin
RS RS
Rf
SW1
1k 1k
100k
V2
+
–
47µ
V1 +–47µ
Rf
20k
(1) AVD: RS = 1kΩ, Rf = 100kΩ, RL = ∞, V1 = V2 = 1/2 VCC
AVD
=
20
log
VO
VIN
+
40
(dB)
(2) SR: f = 1.5kHz, RL = ∞, V1 = V2 = 1/2 VCC
10k
+
–
VCC
VOH
A
(3) VCM: RS = 1kΩ, Rf = 100kΩ, f = 100Hz, V1 = 1/2 VCC, RL = ∞,
and the value of V2 just slightly prior to the point where the output waveform changes.
(4) VOP-P:RS = 1kΩ, Rf = 100kΩ, RL: 20kΩ, f = 100Hz, VOP-P = VOH ↔ VOL [VP-P]
5. Output source current (Iosource) test circuit
Io source: VOH = 10V
V
T
SR = V [V/µs]
T
6. Output sink current (Iosink) test circuit
Io sink: VOL = 1V
10k
–
+
VCC
VOH
A
Rev.1.00 Jun 15, 2005 page 5 of 10
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