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CXB1581Q Просмотр технического описания (PDF) - Sony Semiconductor

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Компоненты Описание
производитель
CXB1581Q
Sony
Sony Semiconductor Sony
CXB1581Q Datasheet PDF : 22 Pages
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CXB1581Q
Electrical Characteristics Measurement Circuit (See Fig. 3 Power Supply Circuits regarding the power supply.)
VI_T
II_T
Measurement device
A
TTL_IN
TTL_OUT
Io_T
V Vo_T
(a) TTL I/O DC characteristics measurement circuit
Pulse
generator
Measurement device
TTL_IN
TTL_OUT
Probe
CL
Oscilloscope
CL = 10pF (including the probe capacitance)
(b) TTL I/O AC characteristics measurement circuit
VI_E
II_E
Measurement device
A
ECL_IN
ECL_OUT
50
VCCE – 2V
V VO_E
(c) ECL I/O DC characteristics measurement circuit
VCCE – 2V
VCCE – 2V
Pulse
generator
50
Measurement device
ECL_IN
ECL_IN
ECL_OUT
ECL_OUT
50
50
Oscilloscope
50
50Transmission Line
VCCE – 2V
VCCE – 2V
CL 2pF (input capacitance of the measurement instrument and floating capacitance)
(d) ECL I/O AC characteristics measurement circuit
Pulse pattern
generator
Measurement device
VCCE – 2V
Triger
26.5625MHz
53.125MHz
20
53.125MBPS
TBC_IN
TX00 to 19
SDOUT
SDOUT
50
1.0625Gbps
50
Oscilloscope
(e) Jitter characteristics measurement circuit
– 16 –
VCCE – 2V

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