CAV24C02(2015) Просмотр технического описания (PDF) - ON Semiconductor

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Компоненты Описание

производитель

CAV24C02
(Rev.:2015)

2-Kb, 4-Kb, 8-Kb and 16-Kb I2C CMOS Serial EEPROM

ON Semiconductor 

CAV24C02, CAV24C04, CAV24C08, CAV24C16

(TSSOP−8)

DEVICE MARKINGS

(SOIC−8)

CSSS

AYMXXX

G

CSSS

SSS

SSS

SSS

SSS

A

Y

M

XXX

G

= Specific Device Code, where

= 02H for CAV24C02

= 04K for CAV24C04

= 08K for CAV24C08

= 16K for CAV24C16

= Assembly Location

= Production Year (Last Digit)

= Production Month (1−9, O, N, D)

= Last Three Digits of Assembly Lot Number

= Pb−Free Package

24CSSS

AYMXXX

G

24CSSS = Specific Device Code, where

SSS = 02H for CAV24C02

SSS = 04K for CAV24C04

SSS = 08K for CAV24C08

SSS = 16K for CAV24C16

A

= Assembly Location

Y

= Production Year (Last Digit)

M

= Production Month (1−9, O, N, D)

XXX = Last Three Digits of Assembly Lot Number

G

= Pb−Free Package

Pin 1 TOP MARKING FOR WLCSP Pin 1

(Ball Down)

X

YM

WLCSP−4

X = Specific Device

X = Code

4 = 24C04

8 = 24C08

6 = 24C16

X

YM

WLCSP−5

Y = Production Year (Last Digit)

M = Production Month (1−9, O, N, D)

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Storage Temperature

−65 to +150

°C

Voltage on any pin with respect to Ground (Note 1)

−0.5 to +6.5

V

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. During input transitions, voltage undershoot on any pin should not exceed −1 V for more than 20 ns. Voltage overshoot on pins A0, A1, A2

and WP should not exceed VCC + 1 V for more than 20 ns, while voltage on the I2C bus pins, SCL and SDA, should not exceed the absolute

maximum ratings, irrespective of VCC.

Table 2. RELIABILITY CHARACTERISTICS (Note 2)

Symbol

Parameter

Min

Units

NEND (Note 3)

Endurance

1,000,000

Program / Erase Cycles

TDR

Data Retention

100

Years

2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.

3. Page Mode, VCC = 5 V, 25°C.

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