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ALD521DSD

24 BIT SERIAL INTERFACE DIGITAL CONTROLLER

Advanced Linear Devices 

ABSOLUTE MAXIMUM RATINGS

Supply voltage, V+

Differential input voltage range

Power dissipation

Operating temperature range PD, SD package

Storage temperature range

Lead temperature, 10 seconds

+7.0V

-0.3V to V+ +0.3V

600 mW

0°C to +70°C

-65°C to +150°C

+260°C

OPERATING ELECTRICAL CHARACTERISTICS

TA = 25oC V+ = +5V unless otherwise specified

Parameter

Symbol

Min

Typ

Supply

Operating Voltage Range

Supply Current

Input Characteristics

Low Input Voltage

High Input Voltage

Input Leakage Current

Output Characteristics

Low Output Voltage

High Output Voltage

CL = 10pF. Rise/Fall Times

Oscillator (OSCIN, OSCOUT)

Crystal Frequency

External Frequency (OSCIN)

Timing Characteristics

Power Up Delay Time

Chip Select Setup Time1

Chip Select Delay Time1

Data Valid Setup Time

Data Valid Time Out Time

Data Out Time

Serial Clock Low Time

Data Not Valid Time

Integration Time 2

Integrator ZERO Time

Autozero Time

V+

3

5

IDD

4.0

VIL

-0.3

VIH

3.5

IIL

-10

VOL

VOH

tR , tF

0.2

3.6

4.8

25

fXTL

fOSC

3.6864

tPU

36

tCS

1.1

tCD

1

tDV

18

tTO

tDOUT

tSC

11

tDNV

15

tINT

16.666

tINTZ

2

tAZ

tINT

Max

Unit

Test Conditions

5.5

V

6.8

mA

1.0

5.3

10

0.8

125

V

V

µA

V

V

nsec

4.0

MHz

4.0

MHz

msec

µsec

Conv. Cycle

µsec

5.5

msec

500

nsec

25

µsec

µsec

300

msec

msec

msec

1 Chip Select Delay time (tCD) may be as short as 7 µsec, if start of auto zero phase cycle time could be

determined. For asynchoronous operation, tCD must be for a minimum of one complete conversion cycle to

assure synchronization to start of auto zero phase cycle time.

2 These are typical practical limits for Integration time. Lower Integration time than the minimum allows more

conversion cycles per second at reduced count resolution. Higher Integration time increases count

resolution, but requires increased capacitor value and lowered number of conversion cycles per second.

Deintegration time depends on selection of full scale input range, integration capacitor value and voltage

reference.

3 ESD Sensitive Device. Stresses above those listed under Absolute Maximum Ratings may cause permanent

damage to device and may affect device reliability.

ALD512D

Advanced Linear Devices

3

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