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ADIS16250(Rev0) Просмотр технического описания (PDF) - Analog Devices

Номер в каталоге
Компоненты Описание
производитель
ADIS16250
(Rev.:Rev0)
ADI
Analog Devices ADI
ADIS16250 Datasheet PDF : 20 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
ADIS16250
Parameter
DAC OUTPUT
Resolution
Relative Accuracy
Differential Nonlinearity
Offset Error
Gain Error
Output Range
Output Impedance
Output Settling Time
LOGIC INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Logic 1 Input Current, IINH
Logic 0 Input Current, IINL
All except RST
RST 2
Input Capacitance, CIN
DIGITAL OUTPUTS
Output High Voltage, VOH
Output Low Voltage, VOL
SLEEP TIMER
Timeout Period3
FLASH MEMORY
Endurance4
Data Retention5
CONVERSION RATE
Minimum Conversion Time
Maximum Conversion Time
Maximum Throughput Rate
Minimum Throughput Rate
POWER SUPPLY
Operating Voltage Range VCC
Power Supply Current
Conditions
5 kΩ/100 pF to GND
For Code 101 to Code 4095
For CS signal when used to wake up from
SLEEP mode
VIH = 3.3 V
VIL = 0 V
ISOURCE = 1.6 mA
ISINK = 1.6 mA
TJ = 55°C
Normal mode at 25°C
Fast mode at 25°C
Sleep mode at 25°C
Min
2.0
2.4
0.5
20,000
20
4.75
Typ
Max
12
4
1
±5
±0.5
0 to 2.5
2
10
0.8
0.55
±0.2
±10
−40
−60
−1
10
0.4
128
3.906
7.75
256
0.129
5.0
5.25
18
44
425
Unit
Bits
LSB
LSB
mV
%
V
Ω
μs
V
V
V
μA
μA
mA
pF
V
V
Sec
Cycles
Years
ms
Sec
SPS
SPS
V
mA
mA
μA
1 The sensor is capable of ±600°/sec but the specifications herein are for ±320°/sec only.
2 The RST pin has an internal pull-up.
3 Guaranteed by design.
4 Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
5 Retention lifetime equivalent at junction temperature (TJ) 55°C as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.
Rev. 0 | Page 4 of 20

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